- EMC COMPO History
- About Saint Petersburg Electrotechnical University "LETI"
- Reducing Switching Noise Effects by Advanced Clock Management. Alex Yakovlev, Milos Krstic, Xin Fan, Milan Babic, Eckhard Grass, Tobias Bjerregaard.
- Methodology of Modeling of the Internal Activity of a FPGA for Conducted Emission Prediction Purpose. Chaimae Ghfiri, Alexandre Boyer, Andre Durier, Sonia Bendhia.
- Analysis of Patterned Magnetic Thin-Film Noise Suppressor for RF IC Chip. Masahiro Yamaguchi, Yasushi Endo, Peng Fan, Jingyan Ma, Satoshi Tanaka, Yasunori Miyazawa, Makoto Nagata.
- Susceptibility Evaluation of CAN Transceiver Circuits with In-Place Waveform Capturing under RF DPI. Kohki Taniguchi, Makoto Nagata, Akihiro Tsukioka, Daisuke Fujimoto, Noriyuki Miura, Takao Egami, Rieko Akimoto, Kenji Niinomi, Terumitsu Komatsu, Yoshinori Fukuba, Atsushi Tomishima.
- Adaptive Current Source Driver for High-Frequency Boost Converter. Volha Subotskaya, Emanuele Bodano, Bernd Deutschmann.
- EMC-Oriented Design of Output Stage of Synchronous Buck Converter. Raul Blecic, Josip Bacmaga, Renaud Gillon, Bart Nauwelaers, Adrijan Baric.
- Theory of Optoelectronic Oscillators Based on Serially Coupled Multiple Micro-Ring Resonators. Vitaliy Vitko, Andrey Nikitin, Alexey Ustinov, Boris Kalinikos.
- Detection Methods of Intense Areas and Identification of the Reasons of HEMT Transistors Failure. Nikita Permiakov, Anton Evseenkov, Sergey Tarasov, Alexander Solomonov, Vyacheslav Moshnikov, Ivan Lamkin.
- Simulation of Electric Field Distribution in GaN HEMTs for the Onset of Structure Degradation. Vladimir Tikhomirov, Aleksandr Gudkov, Victor Petrov, Svetlana Agasieva, Andrei Zybin, Viktor Yankevich, Anton Evseenkov.
- Radiated Suceptibility Investigation of Electronic Board from Near Field Scan Method. Nicolas Lacrampe, Sebastien Serpaud, Alexandre Boyer, Sereirath Tran.
- Impact of NFSI on the Clock Circuit of a Gigabit Ethernet Switch. Massiva Zouaoui, Etienne Sicard, Henri Braquet, Ghislain Rudelou, Emmanuel Marsy and Gilles Jacquemod.
- Circuit Modeling of the ISO 10605 Field Coupled Electrostatic Discharge Test to Design Robust Automotive Integrated Circuits. Niels Lambrecht, Hugo Pues, Daniel De Zutter, Dries Vande Ginste.
- Characterization of a 1-Pin Stress ESD Testing Method for the Analysis of Nanosecond-Range Charging Effects. Friedrich Zur Nieden, Lena Zeitlhofler, Kai Esmark, Reinhold Gartner.
- Equivalent Circuit Model with Nonlinear Characteristics of Zener Diode Extracted from SPICE Model for ESD Simulation. Tohlu Matsushima, Mayumi Aoki, Takashi Hisakado, Osami Wada.
- Conducted Emissions in a 40 nm CMOS Test Chip: The Role of ESD Protections. Mario Rotigni, Mauro Merlo, Martina Cordoni, Paolo Colombo, Valentino Liberali.
- Measurements of EMI Susceptibility of Precision Voltage References. Anna Richelli, Luigi Colalongo, Lorenzo Toninelli, Ion Rusu, Jean-Michel Redoute.
- Disruption of a RF Front-End Subject to a Out-of-Band Signal. Pierre Payet, Jeremy Raoult, Laurent Chusseau.
- Proposal for Combined Conducted and Radiated Emission Modeling for Integrated Circuit. Sebastien Serpaud, Alexandre Boyer, Chaimae Ghfiri, André Durier.
- Modified Kron's TAN Modeling of 3D Multilayer PCB. Zhifei Xu, Yang Liu, Blaise Ravelo, Olivier Maurice.
- EM Field Solver Modelling of the Floating EUT Module Boards in Automotive EMC Test Setups. Sergey Miropolsky, Stefan Jahn, Frank Klotz.
- Analysis of COTS FPGA FPGA SEU-Sensitivity to Combined Effects of Conducted-EMI and TID. Paulo R. C. Villa, Roger C. Goerl, Fabian Vargas, Nilberto Heder Medina, Nemitala Added, Vitor A. P. De Aguiar, Eduardo L. A. Macchione, Fernando Aguirre, Marcilei A. G. Da Silveira, Eduardo Bezerra.
- Digital Systems Clocking with and without clock: a historical retrospective. Alex Yakovlev.
- Method of Simulating Random Shaped Electromagnetic Impulse Penetrating through Conducting Structures. Vadim Goncharov, Eugene Fiskin, Rostislav Yashkardin, Konstantin Sorokin.
- Modelling long-term electromagnetic emission of DC-DC converter. Alexandre Boyer, Manuel Gonzalez Sentis, Chaimae Ghfiri, Andre Durier.
- EMI Resisting Low-EME SENT Drivers in 0.18мm CMOS. M. Burak Baran, Hugo Pues, Kristof Stijnen, Wim Dehaene